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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Terrestrial Neutron-induced Soft Error In Advanced Memory Devices Takashi Nakamura
Libristo kod: 05068958
Nakladnici World Scientific Publishing Co Pte Ltd, travanj 2008
Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concer... Cijeli opis
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Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Informacije o knjizi

Puni naziv Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Autor Takashi Nakamura, Mamoru Baba, Eishi Ibe
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2008
Broj stranica 368
EAN 9789812778819
ISBN 9812778810
Libristo kod 05068958
Nakladnici World Scientific Publishing Co Pte Ltd
Težina 654
Dimenzije 162 x 237 x 20

Kategorija

Computing & Information Technology > Computer hardware > Storage media & peripherals
Technology, Engineering, Agriculture > Technology: general issues
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