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Stress-Induced Phenomena in Metallization

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Stress-Induced Phenomena in Metallization Shinichi Ogawa
Libristo kod: 01391065
Nakladnici Springer, Berlin, studeni 2006
The conference was on reliability related science in ULSI interconnect. Its main purpose was to disc... Cijeli opis
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The conference was on reliability related science in ULSI interconnect. Its main purpose was to discuss the stress induced phenomena in the LSI interconnect among academic researchers and industry engineers to establish academic science and to improve the reliability of ULSI chips. All papers were peer reviewed.

Informacije o knjizi

Puni naziv Stress-Induced Phenomena in Metallization
Autor Shinichi Ogawa, Paul S. Ho, Ehrenfried Zschech
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2007
Broj stranica 204
EAN 9780735404595
ISBN 0735404593
Libristo kod 01391065
Nakladnici Springer, Berlin
Dimenzije 162 x 234

Kategorija

Mathematics & Science > Physics > Optical physics
Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science
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