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Nanometer Technology Designs

Jezik EngleskiEngleski
Knjiga Meki uvez
Knjiga Nanometer Technology Designs Nisar Ahmed
Libristo kod: 01423022
Nakladnici Springer-Verlag New York Inc., prosinac 2011
Traditional at-speed test methods cannot guarantee high quality test results as they face many new c... Cijeli opis
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Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Informacije o knjizi

Puni naziv Nanometer Technology Designs
Autor Nisar Ahmed
Jezik Engleski
Uvez Knjiga - Meki uvez
Datum izdanja 2011
Broj stranica 281
EAN 9781441945594
ISBN 1441945598
Libristo kod 01423022
Nakladnici Springer-Verlag New York Inc.
Težina 462
Dimenzije 155 x 235 x 15

Kategorija

Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Technology: general issues > Engineering: general
Technology, Engineering, Agriculture > Technology: general issues > Nanotechnology
Technology, Engineering, Agriculture > Energy technology & engineering > Electrical engineering
Computing & Information Technology > Graphical & digital media applications > Computer-aided design (CAD)
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