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Fundamentals Of Atomic Force Microscopy - Part I: Foundations

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Fundamentals Of Atomic Force Microscopy - Part I: Foundations Ronald G. Reifenberger
Libristo kod: 03611606
Nakladnici World Scientific Publishing, studeni 2015
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements... Cijeli opis
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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of s

Informacije o knjizi

Puni naziv Fundamentals Of Atomic Force Microscopy - Part I: Foundations
Autor Ronald G. Reifenberger
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2015
Broj stranica 340
EAN 9789814630344
ISBN 9789814630344
Libristo kod 03611606
Nakladnici World Scientific Publishing
Težina 614
Dimenzije 158 x 238 x 23

Kategorija

Mathematics & Science > Science: general issues > Nanosciences
Technology, Engineering, Agriculture > Technology: general issues > Nanotechnology
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