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Fundamentals Of Atomic Force Microscopy - Part I: Foundations

Jezik EngleskiEngleski
Knjiga Meki uvez
Knjiga Fundamentals Of Atomic Force Microscopy - Part I: Foundations Ronald G. Reifenberger
Libristo kod: 03611607
Nakladnici World Scientific Publishing, studeni 2015
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements... Cijeli opis
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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

Informacije o knjizi

Puni naziv Fundamentals Of Atomic Force Microscopy - Part I: Foundations
Autor Ronald G. Reifenberger
Jezik Engleski
Uvez Knjiga - Meki uvez
Datum izdanja 2015
Broj stranica 340
EAN 9789814630351
ISBN 9789814630351
Libristo kod 03611607
Nakladnici World Scientific Publishing
Težina 492
Dimenzije 229 x 155 x 19

Kategorija

Mathematics & Science > Science: general issues > Nanosciences
Technology, Engineering, Agriculture > Technology: general issues > Nanotechnology
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