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Electron Beam Testing Technology

Jezik EngleskiEngleski
Knjiga Meki uvez
Knjiga Electron Beam Testing Technology John T.L. Thong
Libristo kod: 02254694
Nakladnici Springer-Verlag New York Inc., lipanj 2013
This is the first comprehensive volume on electron beam testing for integrated circuits. Including i... Cijeli opis
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This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.

Informacije o knjizi

Puni naziv Electron Beam Testing Technology
Autor John T.L. Thong
Jezik Engleski
Uvez Knjiga - Meki uvez
Datum izdanja 2013
Broj stranica 462
EAN 9781489915245
ISBN 1489915249
Libristo kod 02254694
Nakladnici Springer-Verlag New York Inc.
Težina 905
Dimenzije 178 x 254 x 26

Kategorija

Mathematics & Science > Physics > Materials / States of matter > Condensed matter physics (liquid state & solid state physics)
Mathematics & Science > Chemistry > Analytical chemistry > Spectrum analysis, spectrochemistry, mass spectrometry
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
Mathematics & Science > Science: general issues > Scientific equipment, experiments & techniques
Technology, Engineering, Agriculture > Energy technology & engineering > Electrical engineering
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