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Defects in SiO2 and Related Dielectrics: Science and Technology

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Defects in SiO2 and Related Dielectrics: Science and Technology Gianfranco Pacchioni
Libristo kod: 01396617
Nakladnici Springer, prosinac 2000
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from... Cijeli opis
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241.01 €
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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Informacije o knjizi

Puni naziv Defects in SiO2 and Related Dielectrics: Science and Technology
Autor Gianfranco Pacchioni, Linards Skuja, David L. Griscom
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2000
Broj stranica 624
EAN 9780792366850
ISBN 0792366859
Libristo kod 01396617
Nakladnici Springer
Težina 2340
Dimenzije 155 x 235 x 38

Kategorija

Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science > Testing of materials
Mathematics & Science > Physics > Materials / States of matter
Mathematics & Science > Physics > Electricity, electromagnetism & magnetism
Mathematics & Science > Chemistry > Crystallography
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