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Defects in Microelectronic Materials and Devices

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Defects in Microelectronic Materials and Devices Daniel M. Fleetwood
Libristo kod: 06681094
Nakladnici Taylor & Francis Inc, studeni 2008
Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect tran... Cijeli opis
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Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. This book discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices.

Informacije o knjizi

Puni naziv Defects in Microelectronic Materials and Devices
Autor Daniel M. Fleetwood
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2008
Broj stranica 770
EAN 9781420043761
ISBN 9781420043761
Libristo kod 06681094
Nakladnici Taylor & Francis Inc
Težina 1520
Dimenzije 185 x 260 x 42

Kategorija

Mathematics & Science > Physics > Materials / States of matter > Condensed matter physics (liquid state & solid state physics)
Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering
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