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Conductive Atomic Force Microscopy

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Conductive Atomic Force Microscopy Mario Lanza
Libristo kod: 15737297
Nakladnici Wiley-VCH Verlag GmbH, listopad 2017
The first book to summarize the applications of CAFM as the most important method in the study of el...
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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.

Informacije o knjizi

Puni naziv Conductive Atomic Force Microscopy
Autor Mario Lanza
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2017
Broj stranica 384
EAN 9783527340910
ISBN 9783527340910
Libristo kod 15737297
Nakladnici Wiley-VCH Verlag GmbH
Težina 978
Dimenzije 251 x 176 x 25

Kategorija

Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
Technology, Engineering, Agriculture > Technology: general issues > Nanotechnology
Technology, Engineering, Agriculture > Other technologies & applied sciences > Applied optics
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