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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Andrei Pavlov
Libristo kod: 01418343
Nakladnici Springer-Verlag New York Inc., svibanj 2008
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of top... Cijeli opis
? points 494 b
197.44 €
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Informacije o knjizi

Puni naziv CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Autor Andrei Pavlov, Manoj Sachdev
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 2008
Broj stranica 194
EAN 9781402083624
ISBN 1402083629
Libristo kod 01418343
Nakladnici Springer-Verlag New York Inc.
Težina 468
Dimenzije 166 x 239 x 19

Kategorija

Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Technology: general issues > Engineering: general
Computing & Information Technology > Computer hardware > Storage media & peripherals
Computing & Information Technology > Computer science > Computer architecture & logic design
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