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Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Jezik EngleskiEngleski
Knjiga Tvrdi uvez
Knjiga Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Samuel H. Cohen
Libristo kod: 01379186
Nakladnici Springer Science+Business Media, prosinac 1999
This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposi... Cijeli opis
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This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Informacije o knjizi

Puni naziv Atomic Force Microscopy/Scanning Tunneling Microscopy 3
Autor Samuel H. Cohen, Marcia L. Lightbody
Jezik Engleski
Uvez Knjiga - Tvrdi uvez
Datum izdanja 1999
Broj stranica 210
EAN 9780306462979
ISBN 0306462974
Libristo kod 01379186
Nakladnici Springer Science+Business Media
Težina 635
Dimenzije 178 x 254 x 20

Kategorija

Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science > Testing of materials
Mathematics & Science > Science: general issues > Scientific equipment, experiments & techniques
Mathematics & Science > Physics > Nuclear physics
Mathematics & Science > Chemistry > Analytical chemistry
Mathematics & Science > Biology, life sciences
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